Multicomponent wavefield characterization with a novel scanning laser interferometer
Blum, Thomas E., van Wijk, Kasper, Pouet, Bruno, Wartelle, AlexisVolume:
81
Year:
2010
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3455213
File:
PDF, 985 KB
english, 2010