[IEEE IEEE Symposium on Ultrasonics - Honolulu, HI, USA (4-7 Dec. 1990)] IEEE Symposium on Ultrasonics - Cracklike defects sizing from co-occurrence matrix
Moysan, J., Corneloup, G., Magnin, I., Benoist, P., Basset, O.Year:
1990
Language:
english
DOI:
10.1109/ultsym.1990.171542
File:
PDF, 410 KB
english, 1990