[IEEE IEEE Symposium on Ultrasonics - Honolulu, HI, USA...

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[IEEE IEEE Symposium on Ultrasonics - Honolulu, HI, USA (4-7 Dec. 1990)] IEEE Symposium on Ultrasonics - Cracklike defects sizing from co-occurrence matrix

Moysan, J., Corneloup, G., Magnin, I., Benoist, P., Basset, O.
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Year:
1990
Language:
english
DOI:
10.1109/ultsym.1990.171542
File:
PDF, 410 KB
english, 1990
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