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Robust Compact Model for Bipolar Oxide-Based Resistive Switching Memories
Bocquet, Marc, Deleruyelle, Damien, Aziza, Hassen, Muller, Christophe, Portal, Jean-Michel, Cabout, Thomas, Jalaguier, EricVolume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2296793
Date:
March, 2014
File:
PDF, 1.94 MB
english, 2014