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Testing Embedded Cores
Anderson, T.L., Chandramouli, R., Dey, S., Hemmady, S., Mallipeddi, C., Rajsuman, R., Walther, R., Zorian, Y.Volume:
14
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.1997.587747
Date:
April, 1997
File:
PDF, 302 KB
english, 1997