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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Efficient Embedding of Deterministic Test Data
Majeed, Mudassar, Ahlstrom, Daniel, Ingelsson, Urban, Carlsson, Gunnar, Larsson, ErikYear:
2010
Language:
english
DOI:
10.1109/ats.2010.36
File:
PDF, 281 KB
english, 2010