A device for surface study of confined micron thin films in...

Review of Scientific Instruments 2002 Vol. 73; Iss. 6

A device for surface study of confined micron thin films in a total internal reflection geometry

Mamedov, Sergey, Schwab, Alexander D., Dhinojwala, Ali
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Volume:
73
Year:
2002
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1473222
File:
PDF, 436 KB
english, 2002
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