Determination of trap distributions from current characteristics of pentacene field-effect transistors with surface modified gate oxide
Scheinert, Susanne, Pernstich, Kurt P., Batlogg, Bertram, Paasch, GernotVolume:
102
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2803742
File:
PDF, 1.89 MB
english, 2007