[IEEE 10th IEEE High Assurance Systems Engineering...

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[IEEE 10th IEEE High Assurance Systems Engineering Symposium (HASE'07) - Plano, TX, USA (2007.11.14-2007.11.16)] 10th IEEE High Assurance Systems Engineering Symposium (HASE'07) - Parsimonious classifiers for software quality assessment

Shin, Miyoung, Ratanothayanon, Sunida, Goel, Amrit L., Paul, Raymond A.
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Year:
2007
Language:
english
DOI:
10.1109/hase.2007.75
File:
PDF, 536 KB
english, 2007
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