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A New Mechanism of Failure in Silicon p + /n Junction Induced by Diffusion Barrier Metals
Igarashi, Yasushi, Yamaji, Tetsuo, Nishikawa, SatoshiVolume:
29
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.29.l2337
Date:
December, 1990
File:
PDF, 930 KB
1990