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InGaAs∕InP quantum well intermixing studied by high-resolution x-ray diffraction and grazing incidence x-ray analysis
Piva, P. G., Mitchell, I. V., Chen, Huajie, Feenstra, R. M., Aers, G. C., Poole, P. J., Charbonneau, S.Volume:
97
Year:
2005
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1870114
File:
PDF, 602 KB
english, 2005