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[IRE 1982 International Electron Devices Meeting - ()] 1982 International Electron Devices Meeting - A regional analytic model for current interruption in high voltage center gated bipolar switches
Kohl, J.E., Gammel, J.C., Hartman, A.R., Hirsch, M.D., Riley, T.J., Scott, R.S.Year:
1982
Language:
english
DOI:
10.1109/iedm.1982.190331
File:
PDF, 612 KB
english, 1982