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Bichromatic force measurements using atomic beam deflections
Williams, M. R., Chi, F., Cashen, M. T., Metcalf, H.Volume:
61
Language:
english
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.61.023408
Date:
January, 2000
File:
PDF, 121 KB
english, 2000