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Comparison of wet and dry etching of zinc indium oxide for thin film transistors with an inverted gate structure
Marrs, Michael A., Vogt, Bryan D., Raupp, Gregory B.Volume:
30
Year:
2012
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.3668090
File:
PDF, 2.13 MB
english, 2012