Self-consistent study of localization in thin films

Physical Review B 2002 / 8 Vol. 66; Iss. 7

Self-consistent study of localization in thin films

Brojen Singh, R. K., Kumar, Deepak
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Volume:
66
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.66.075123
Date:
August, 2002
File:
PDF, 75 KB
english, 2002
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