Characterization of electronic structure of silicon...

Applied Physics Letters 2010 Vol. 96; Iss. 22

Characterization of electronic structure of silicon nanocrystals in silicon nitride by capacitance spectroscopy

Cho, Chang-Hee, Kim, Baek-Hyun, Kim, Sang-Kyun, Park, Seong-Ju
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
96
Year:
2010
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3431572
File:
PDF, 1004 KB
english, 2010
Conversion to is in progress
Conversion to is failed