![](/img/cover-not-exists.png)
Scanning x-ray microscope with 75-nm resolution
Rarback, H., Shu, D., Feng, S. C., Ade, H., Kirz, J., McNulty, I., Kern, D. P., Chang, T. H. P., Vladimirsky, Y., Iskander, N., Attwood, D., McQuaid, K., Rothman, S.Volume:
59
Year:
1988
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1139965
File:
PDF, 1.29 MB
english, 1988