![](/img/cover-not-exists.png)
[IEEE 2010 32nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC 2010) - Buenos Aires (2010.08.31-2010.09.4)] 2010 Annual International Conference of the IEEE Engineering in Medicine and Biology - High-k dielectric fabrication process to minimize mobile ionic penetration
Parent, David W, Davis, Janet, Basham, Eric JYear:
2010
Language:
english
DOI:
10.1109/iembs.2010.5627801
File:
PDF, 497 KB
english, 2010