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[IEEE 2008 IEEE International SOI Conference - New Paltz, NY (2008.10.6-2008.10.9)] 2008 IEEE International SOI Conference - Variability and power management in sub-100nm SOI technology for reliable high performance systems
Das, Koushik, Bernstein, Kerry, Burns, Jeff, Gebara, Fadi, Shih-Hsien Lo,, Nowka, Kevin, Rao, Rahul, Rosenfield, MichaelYear:
2008
Language:
english
DOI:
10.1109/soi.2008.4656268
File:
PDF, 358 KB
english, 2008