Simultaneous analysis of multiple extended x-ray-absorption...

Physical Review B 1992 / 6 Vol. 45; Iss. 23

Simultaneous analysis of multiple extended x-ray-absorption fine-structure spectra: Application to studies of buried Ge-Si interfaces

Aebi, P., Tyliszczak, T., Hitchcock, A. P., Baines, K. M., Sham, T. K., Jackman, T. E., Baribeau, J-M., Lockwood, D. J.
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Volume:
45
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.45.13579
Date:
June, 1992
File:
PDF, 544 KB
english, 1992
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