Structural and electronic properties of ultrathin polycrystalline Si layers on glass prepared by aluminum-induced layer exchange
Antesberger, T., Jaeger, C., Scholz, M., Stutzmann, M.Volume:
91
Year:
2007
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2803072
File:
PDF, 504 KB
english, 2007