[IEEE Conference on Precision Electromagnetic: Measurements - Washington, DC, USA (6-10 July 1998)] 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254) - Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor
Jeffery, A., Lee, L.H., Shields, J.Q.Year:
1998
Language:
english
DOI:
10.1109/cpem.1998.700000
File:
PDF, 222 KB
english, 1998