[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - Electrical and testing reliability of CuxO based RRAM
Wan, Haijun, Tian, Xiaopeng, Song, Yali, Luo, Wenjin, Wang, Ming, Wang, Yanliang, Zhou, Peng, Lin, YinyinYear:
2010
Language:
english
DOI:
10.1109/icsict.2010.5667559
File:
PDF, 1.56 MB
english, 2010