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[IEEE TENCON 2007 - 2007 IEEE Region 10 Conference - Taipei, Taiwan (2007.10.30-2007.11.2)] TENCON 2007 - 2007 IEEE Region 10 Conference - Testing transition delay faults in modified Booth multipliers by using C-testable and SIC patterns
Hsing-Chung Liang,, Pao-Hsin Huang,Year:
2007
Language:
english
DOI:
10.1109/tencon.2007.4429067
File:
PDF, 252 KB
english, 2007