Defect recognition via longitudinal mode analysis of high...

Journal of Applied Physics 2001 Vol. 90; Iss. 1

Defect recognition via longitudinal mode analysis of high power fundamental mode and broad area edge emitting laser diodes

Klehr, A., Beister, G., Erbert, G., Klein, A., Maege, J., Rechenberg, I., Sebastian, J., Wenzel, H., Tränkle, G.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
90
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1347408
File:
PDF, 942 KB
english, 2001
Conversion to is in progress
Conversion to is failed