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Calibration and evaluation of scanning-force-microscopy probes
Sheiko, S. S., Möller, M., Reuvekamp, E. M. C. M., Zandbergen, H. W.Volume:
48
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.48.5675
Date:
August, 1993
File:
PDF, 1.45 MB
english, 1993