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Detection of high-κ and interfacial layer breakdown using...

Detection of high-κ and interfacial layer breakdown using the tunneling mechanism in a dual layer dielectric stack

Raghavan, N., Pey, K. L., Li, X.
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Volume:
95
Year:
2009
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3269589
File:
PDF, 607 KB
english, 2009
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