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[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Single event burnout as the failure mode for a low voltage MOSFET driver
Scheick, Leif, Miyahira, TetsuoYear:
2007
Language:
english
DOI:
10.1109/radecs.2007.5205568
File:
PDF, 4.67 MB
english, 2007