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Scanning-electron-microscope technique for measuring electrical conductivity: Application to tetrathiafulvalene-tetracyanoquinodimethane
Long, James P., Slichter, Charles P.Volume:
21
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.21.4521
Date:
May, 1980
File:
PDF, 898 KB
english, 1980