![](/img/cover-not-exists.png)
[IEEE 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (2007.02.11-2007.02.15)] 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure
Mukhopadhyay, Saibal, Kim, Keunwoo, Jenkins, Keith A., Chuang, Ching-Te, Roy, KaushikYear:
2007
Language:
english
DOI:
10.1109/isscc.2007.373463
File:
PDF, 3.00 MB
english, 2007