Conducting probe atomic force microscopy applied to organic conducting blends
Planès, Jérôme, Houzé, Frédéric, Chrétien, Pascal, Schneegans, OlivierVolume:
79
Year:
2001
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1413717
File:
PDF, 1.09 MB
english, 2001