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Modeling the nanoscale linear response of superconducting thin films measured by a scanning probe microwave microscope
Tai, Tamin, Ghamsari, B. G., Anlage, Steven M.Volume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4878937
Date:
May, 2014
File:
PDF, 870 KB
english, 2014