Analysis of multilayer-multiconductor structures on...

IEEE Transactions on Components Packaging and Manufacturing Technology Part B 1995 / Aug. Vol. 18; Iss. 3

Analysis of multilayer-multiconductor structures on anisotropic substrates using the finite difference method

Jatkar, D.D., Beker, B.
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Volume:
18
Language:
english
Journal:
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B
DOI:
10.1109/96.404112
Date:
January, 1995
File:
PDF, 480 KB
english, 1995
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