Model-Based 2.5-D Deconvolution for Extended Depth of Field...

IEEE Transactions on Image Processing 2008 / 07 Vol. 17; Iss. 7

Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy

Aguet, F., Van De Ville, D., Unser, M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
17
Language:
english
Journal:
IEEE Transactions on Image Processing
DOI:
10.1109/tip.2008.924393
Date:
July, 2008
File:
PDF, 2.69 MB
english, 2008
Conversion to is in progress
Conversion to is failed