Modelling and testing for bridging faults in CMOS and...

International Journal of Electronics 1997 / 10 Vol. 83; Iss. 4

Modelling and testing for bridging faults in CMOS and BiCMOS combinational circuits

ISMAEEL, ASAD A., BHATNAGAR, RAKESH
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Volume:
83
Language:
english
Journal:
International Journal of Electronics
DOI:
10.1080/002072197135337
Date:
October, 1997
File:
PDF, 203 KB
english, 1997
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