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Extrinsic origins of electrical transport anomalies near the superconducting transition in mesoscopic aluminum lines
Burk, B., Chien, C.-J., Chandrasekhar, V., Strunk, C., Bruyndoncx, V., Van Haesendonck, C., Moshchalkov, V. V., Bruynseraede, Y.Volume:
83
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.366864
File:
PDF, 357 KB
english, 1998