Morphology and grain structure evolution during epitaxial...

Morphology and grain structure evolution during epitaxial growth of Ag films on native-oxide-covered Si surface

Hur, Tae-Bong, Kim, Hong Koo, Perello, David, Yun, Minhee, Kulovits, Andreas, Wiezorek, Jörg
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Volume:
103
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2924323
File:
PDF, 835 KB
english, 2008
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