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[IEEE 2013 International Conference on Anti-Counterfeiting, Security and Identification (ASID) - Shanghai, China (2013.10.25-2013.10.27)] 2013 International Conference on Anti-Counterfeiting, Security and Identification (ASID) - A high precision CMOS band-gap reference with exponential curvature-compensation
Yin, Yongsheng, Li, Dewu, Deng, HonghuiYear:
2013
Language:
english
DOI:
10.1109/icasid.2013.6825293
File:
PDF, 525 KB
english, 2013