Quantitative model for near-field scanning microwave...

Review of Scientific Instruments 2008 Vol. 79; Iss. 11

Quantitative model for near-field scanning microwave microscopy: Application to metrology of thin film dielectrics

Reznik, Alexander N., Talanov, Vladimir V.
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Volume:
79
Year:
2008
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3020705
File:
PDF, 575 KB
english, 2008
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