Hard x-ray scanning microscopy with coherent radiation: Beyond the resolution of conventional x-ray microscopes
Schropp, A., Hoppe, R., Patommel, J., Samberg, D., Seiboth, F., Stephan, S., Wellenreuther, G., Falkenberg, G., Schroer, C. G.Volume:
100
Year:
2012
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4729942
File:
PDF, 938 KB
english, 2012