A soft/hard x-ray beamline for surface EXAFS studies in the energy range 0.8–15 keV
MacDowell, A. A., Hashizume, T., Citrin, P. H.Volume:
60
Year:
1989
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1140884
File:
PDF, 707 KB
english, 1989