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Performance of MVTL OR-AND gates when data precedes bias
Meier, D.L., Przybysz, J.X.Volume:
3
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.233515
Date:
March, 1993
File:
PDF, 692 KB
english, 1993