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[IEEE 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (2007.02.11-2007.02.15)] 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A 500MHz Random Cycle 1.5ns-Latency, SOI Embedded DRAM Macro Featuring a 3T Micro Sense Amplifier
Barth, John, Reohr, William, Parries, Paul, Fredeman, Greg, Golz, John, Schuster, Stanley, Matick, Richard, Hunter, Hillery, Ill, CharlesTanner, Harig, Joseph, Kim, Hoki, Khan, Babar, Griesemer, John,Year:
2007
Language:
english
DOI:
10.1109/isscc.2007.373506
File:
PDF, 2.99 MB
english, 2007