180° surface domain wall magnetization profiles: Comparisons between scanning electron microscopy with polarization analysis measurements, magneto-optic Kerr microscopy measurements and micromagnetic models
Scheinfein, M. R., Ryan, P. J., Unguris, J., Pierce, D. T., Celotta, R. J.Volume:
57
Year:
1990
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.104144
File:
PDF, 601 KB
english, 1990