Low-temperature pseudo-metal-oxide-semiconductor field-effect transistor measurements on bare silicon-on-insulator wafers
Diab, A., Pirro, L., Ionica, I., Mescot, X., Ghibaudo, G., Cristoloveanu, S.Volume:
101
Year:
2012
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4748984
File:
PDF, 982 KB
english, 2012