A highly sensitive evaluation method for the determination of different current conduction mechanisms through dielectric layers
Murakami, Katsuhisa, Rommel, Mathias, Yanev, Vasil, Erlbacher, Tobias, Bauer, Anton J., Frey, LotharVolume:
110
Year:
2011
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3631088
File:
PDF, 1.45 MB
english, 2011