Extended-Defect-Related Photoluminescence Line at 3.33 eV in Nanostructured ZnO Thin Films
Guillemin, Sophie, Consonni, Vincent, Masenelli, Bruno, Bremond, GeorgesVolume:
6
Language:
english
Journal:
Applied Physics Express
DOI:
10.7567/APEX.6.111101
Date:
November, 2013
File:
PDF, 4.72 MB
english, 2013