Scanning low-temperature element-specific magnetic...

Review of Scientific Instruments 2005 Vol. 76; Iss. 6

Scanning low-temperature element-specific magnetic microscopy

Cady, A., Haskel, D., Lang, J. C., Srajer, G., Chupas, P., Osborn, R., Mitchell, J. F., Ahn, J. S., Hur, N., Park, S., Cheong, S.-W.
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Volume:
76
Year:
2005
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1921510
File:
PDF, 1.01 MB
english, 2005
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