[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - A study of inverse narrow width effect of 65nm low power CMOS technology
Liu Xinfu,, Lim Kheeyong,, Wu Zhihua,, Xiong Zhibin,, Ding Yongping,, Nong Hao,, Wu Yanping,, Shen Yanping,, Tang Bin,, Lim Louis,, Chwa Sally,, Yu Xing,, Hong Feng,, Simon Yang,Year:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734750
File:
PDF, 5.21 MB
english, 2008