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[IEEE International Symposium on Electromagnetic Compatibility - Beijing, China (21-24 May 2002)] 2002 3rd International Symposium on Electromagnetic Compatibility - Application of guard traces with vias in the RF PCB layout

Li Zhi,, Wang Qiang,, Shi Changsheng,
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Year:
2002
Language:
english
DOI:
10.1109/elmagc.2002.1177544
File:
PDF, 171 KB
english, 2002
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