![](/img/cover-not-exists.png)
[IEEE International Symposium on Electromagnetic Compatibility - Beijing, China (21-24 May 2002)] 2002 3rd International Symposium on Electromagnetic Compatibility - Application of guard traces with vias in the RF PCB layout
Li Zhi,, Wang Qiang,, Shi Changsheng,Year:
2002
Language:
english
DOI:
10.1109/elmagc.2002.1177544
File:
PDF, 171 KB
english, 2002