Method to assess the grain crystallographic orientation...

Applied Physics Letters 2006 Vol. 89; Iss. 15

Method to assess the grain crystallographic orientation with a submicronic spatial resolution using Kelvin probe force microscope

Gaillard, Nicolas, Gros-Jean, Mickael, Mariolle, Denis, Bertin, François, Bsiesy, Ahmad
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Volume:
89
Year:
2006
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2359297
File:
PDF, 584 KB
english, 2006
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